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Model MP-4000 with Axial Field Probe PM4-A
Experience a revolution in measurement technology with the List-Magnetik MP-4000 professional magnetic field meter. This instrument uses external digital axial and transverse field probes to make precise measurements of DC and AC magnetic fields, as well as pulsed fields of any type. Applications range from geomagnetic fields to field strengths of 40,000 A/cm.
The MP-4000 gaussmeter has a graphical LCD touch panel with an innovative user interface and a resolution of 320x480 pixels. An outstanding feature of the new probe electronics is the fast digitization of the measured values with a frequency of up to 200 kHz. This makes it possible to display waveforms with a duration of only 0.1 milliseconds. This gives you a precise picture of the course of a magnetic field pulse. Peak values and pulse durations are accurately displayed. In addition, alternating field waveforms up to 20 kHz can be acquired and stored.
It supports a wide range of magnetic field measurement applications with flexible data storage, a combined digital and analog display, and peak value measurement. The wireless interface allows data transfer to a Windows PC as well as to Android and iOS apps. The USB interface allows the device to be permanently connected to an external power source.
Especially at very low magnetic field strengths, an absolutely interference-free and precise measurement is crucial. The measurement electronics work directly in the probe and digitize the signals from the Hall sensor.
In the case of stable DC fields, the scan function makes it possible to detect a magnetic field by area, which can then be statistically evaluated. In the case of pulsed fields, the digital probe of the MP-4000 processes the measurements at a speed of less than 0.1 milliseconds. The measured values can be displayed graphically in the MP-4000, providing an accurate picture of the course of a magnetic field pulse.
With Axial Field Probe PM4-A. The axial field probe measures the field along the longitudinal axis of the probe.
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